Jana Šmídová, Tescan Group a.s., Brno, Czech Republic

Julia Mahamid, Molecular Systems Biology Unit, EMBL, Heidelberg, Germany

Understanding biological structures across multiple scales—from whole cells and tissues down to macromolecular assemblies—requires preparation and imaging workflows that are both precise and robust. Cryogenic focused ion beam–scanning electron microscopy (cryo‑FIB‑SEM) has become a key enabling technology in this context, particularly for the preparation of thin lamellae for cryo‑electron tomography and, more recently, for three‑dimensional imaging of vitrified specimens.

Despite its growing importance, the routine implementation of cryo‑FIB‑SEM workflows remains challenging for many laboratories. Long preparation times, difficult targeting of regions of interest, and the inherent complexity of operating under cryogenic conditions often hinder reproducibility and limit broader adoption.

In this workshop, we present our approach to developing and optimizing cryo‑FIB‑SEM workflows in close collaboration with life science researchers using the TESCAN SOLARIS X 2 platform. These efforts are carried out in close partnership with EMBL Heidelberg, under the scientific guidance of Dr. Julia Mahamid, a leading expert in in-situ structural biology.

Our joint work focuses on systematically addressing experimentally relevant questions raised by the user community: how to reduce preparation time without compromising data quality, how to improve reproducibility across users and specimen types, and how to reliably identify structures of interest within vitrified samples.

Dr. Mahamid will share how the SOLARIS X 2 system—and the associated co‑development efforts—are integrated into everyday research projects in her laboratory, with a particular focus on recent results demonstrating how standard versus low‑kV polishing using the MISTRAL™ Xe plasma FIB influence data yield and quality.

The workshop will further highlight key components of the workflow, including the MISTRAL™ Xe plasma FIB for stable, high‑current milling and controlled low‑kV polishing, as well as the Delmic METEOR™ 2.0 integrated cryo‑fluorescence microscope for in situ fluorescence‑guided targeting within the cryo‑FIB‑SEM chamber. Together, these technologies aim to enhance targeting accuracy, enable efficient access to deeply embedded regions of interest, and support reproducible lamella preparation, as well as large‑volume cryogenic cross‑sectioning and three‑dimensional analysis.

Don’t miss the opportunity to take part in the practical session, visit the laboratory, and interact directly with EMBL and Tescan experts. Capacity is limited, so early registration is recommended.